Scanning Electron Microscope

had Yoraz b Internal SEM TEM good Based on sattered is Band on transmitted as. scattered IS in SEM are No other classification of es in classified as backscattered or TEM 20 electrons The scattered es in SEM Produce es are directly Pointed toward the Images of the sample after the Sample the microscope collects and Counts the scattered is TEM seeks to see what is SEM focuses on the Sample's inside/ beyond the surface surface and its composition SEMONly offer 2 million as a TEM has uptoa 50 million max level of magnifiation magnification level and a and a resolution of 0.4 nm resolution of 0.5 anystorms. Thuko samples in addresample TEM Sample is cut thinner. is "Stained" by an element that laptures the scattered as - SEM Shows the Sample bit by TEM shows the sampleas bit a whole SEM Provides a 3D image TEM delivers a 2D Picture.

Carl Zeiss - Make Optical len. SEM Instrumentation High magnification TEM then only SEM In SEM and TEM the detector Part is different ie, SEM - Surface Analysis , up and down so diff reflaction Pattern 1 TEM- Negative staining Structural organisation in microbes (fungi, bacteria; Viru) -TEM Sungi and bacteria 10,000 X. Per In light fied > IN 500 nm. In TEM > ~ 0.2 nm , (AS low light is used nalow wavelength) - SEM - Analysed by moving the object -we use 0.2 mm ulthrathin specimen. - -H can be or stained I not and Placed on crip and crip placed in minosopy. TENG - 2n, black and white / 50 million, good resolution

SEM - light Source tungsten filament lam (es are used that is unitted from tungton flament) In TEM - electromagnatic less - - It should be tightly parked as e core used. we so use anode (tve) that help us to the e to pass on both d=1 NA distance I magnification